A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations

Wujie Wen, Mengjie Mao, Hai Li, Yiran Chen, Yukui Pei, Ning Ge. A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 1285-1290, IEEE, 2016. [doi]

Abstract

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