Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita. Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. J. Electronic Testing, 24(4):379-391, 2008. [doi]
Abstract is missing.