Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng. Simulation-based functional test generation for embedded processors. In Tenth IEEE International High-Level Design Validation and Test Workshop 2005, Napa Valley, CA, USA, November 30 - December 2, 2005. pages 3-10, IEEE Computer Society, 2005. [doi]
Abstract is missing.