Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita. On Low-Capture-Power Test Generation for Scan Testing. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 265-270, IEEE Computer Society, 2005. [doi]
Abstract is missing.