David Wessels, Jon C. Muzio. Probabilistic Identification of Critical Components for Circuit Delays. In Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli, editors, The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. pages 215-222, IEEE Computer Society, 1993.
Abstract is missing.