ESD event simulation automation using automatic extraction of the relevant portion of a full chip - researchr publication authors

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Thorsten Weyl, Dave Clarke, Karl Rinne, James A. Power. ESD event simulation automation using automatic extraction of the relevant portion of a full chip. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 414-418, IEEE, 2009. [doi]

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Dave Clarke

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