Thorsten Weyl, Dave Clarke, Karl Rinne, James A. Power. ESD event simulation automation using automatic extraction of the relevant portion of a full chip. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 414-418, IEEE, 2009. [doi]
@inproceedings{WeylCRP09,
title = {ESD event simulation automation using automatic extraction of the relevant portion of a full chip},
author = {Thorsten Weyl and Dave Clarke and Karl Rinne and James A. Power},
year = {2009},
doi = {10.1109/ISQED.2009.4810330},
url = {http://dx.doi.org/10.1109/ISQED.2009.4810330},
researchr = {https://researchr.org/publication/WeylCRP09},
cites = {0},
citedby = {0},
pages = {414-418},
booktitle = {10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA},
publisher = {IEEE},
}