C. Wickman, Duncan G. Elliott, Bruce F. Cockburn. Cost Models for Large File Memory DRAMs with ECC and Bad Block Marking. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 319, IEEE Computer Society, 1999. [doi]
Abstract is missing.