Reliability and characteristics of the Illiac electrostatic memory

Joseph M. Wier. Reliability and characteristics of the Illiac electrostatic memory. In John H. Howard, editor, Papers and discussions presented at the 1953 eastern joint AIEE-IRE computer conference - information processing systems - reliability and requirements, AIEE-IRE 1953 (Eastern), Washington, D.C., USA, December 8-10, 1953. pages 72-77, ACM, 1953. [doi]

Abstract

Abstract is missing.