Papers and discussions presented at the 1953 eastern joint AIEE-IRE computer conference - information processing systems - reliability and requirements, AIEE-IRE 1953 (Eastern), Washington, D.C., USA, December 8-10, 1953 - researchr publication

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John H. Howard, editor, Papers and discussions presented at the 1953 eastern joint AIEE-IRE computer conference - information processing systems - reliability and requirements, AIEE-IRE 1953 (Eastern), Washington, D.C., USA, December 8-10, 1953. ACM, 1953. [doi]

Conference: aieeire1953

Abstract is missing.

Keynote addressHoward T. Engstrom. 7 [doi]

The RETMA support of the 1950 computer conference: a progress reportThomas H. Briggs. 8-10 [doi]

The use of electronic data processing systems in the life insurance businessM. E. Davis. 11-18 [doi]

Computer applications in air traffic controlVernon I. Weihe. 18-22 [doi]

Data processing requirements for the purposes of numerical weather predictionJoseph Smagorinsky. 22-30 [doi]

Methods used to improve reliability in military electronics equipmentL. D. Whitelock. 31-33 [doi]

Digital computers for linear, real-time control systemsRalph B. Conn. 33-37 [doi]

The MIT magnetic-core memoryWilliam N. Papian. 37-42 [doi]

Reliability experience on the OARACRobert W. House. 43-45 [doi]

Operating experience with the Los Alamos 701Willard G. Bouricius. 45-47 [doi]

Acceptance test for Raytheon hurricane computerFrancis J. Murray. 48-52 [doi]

Reliability of a large REAC installationBernard Loveman. 53-57 [doi]

Computer performance tests employed by the National Bureau of StandardsS. N. Alexander, R. D. Elbourn. 58-61 [doi]

Experience on the Air Force UNIVACRobert Kopp. 62-67 [doi]

Electron tube and crystal diode experience in computing equipmentJ. A. Goetz, H. J. Geisler. 67-72 [doi]

Reliability and characteristics of the Illiac electrostatic memoryJoseph M. Wier. 72-77 [doi]

Electron tube performance in some typical military environmentsD. W. Sharp. 77-83 [doi]

SEAC: review of three years of operationPhil D. Shupe Jr., Russell A. Kirsch. 83-90 [doi]

A review of ORDVAC operating experienceCharles R. Williams. 91-95 [doi]

Some remarks on logical design and programming checksHerman H. Goldstine. 96-98 [doi]

The advantages of built-in checkingJohn W. Mauchly. 99-101 [doi]

Recent progress in the production of error-free magnetic computer tapeJ. C. Chapman, W. W. Wetzel. 102-104 [doi]

Reliability of electrolytic capacitors in computersMark VanBuskirk. 105-109 [doi]

Resistor reliability - whose responsibility?: some case historiesJesse Marsten. 109-112 [doi]

Reliability and its relation to suitability and predictabilityEnoch B. Ferrell. 113-116 [doi]

Summary of AIEE-IRE-ACM conferenceAllen V. Astin. 116-118 [doi]

Group discussion on diagnostic checksJ. J. Eachus. 119 [doi]

Group discussion on crystal diodesRalph J. Slutz. 120 [doi]

Group discussion on technical applicationsGeorge W. Petrie III. 121 [doi]

Group discussion on magnetic-tape standardsAllen Shoup. 121-122 [doi]

Group discussion on commercial and industrial applications of computersW. F. Frese. 123 [doi]

After-luncheon remarksHerbert R. J. Grosch. 124-125 [doi]

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