Brian R. Wier, Rafael Perez Martinez, Uppili S. Raghunathar, Hanbin Ying, Saeed Zeinolabedinzadeh, John D. Cressler. Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design. In 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), San Diego, CA, USA, October 15-17, 2018. pages 215-218, IEEE, 2018. [doi]
Abstract is missing.