Mark Wilkening, Fritz Previlon, David R. Kaeli, Sudhanva Gurumurthi, Steven Raasch, Vilas Sridharan. Evaluating the Resilience of Parallel Applications. In 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.