David Williams, Anthony P. Ambler. System Manufacturing Test Cost Model. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 482-490, IEEE Computer Society, 2002. [doi]
@inproceedings{WilliamsA02:0,
title = {System Manufacturing Test Cost Model},
author = {David Williams and Anthony P. Ambler},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430482abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/WilliamsA02%3A0},
cites = {0},
citedby = {0},
pages = {482-490},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}