Anthony P. Ambler - researchr alias

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Viewing Publication 1 - 23 from 23

2009

A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded SystemLftikhar Khan, Taikyeong T. Jeong, Gyungleen Park, Anthony P. Ambler. snpd 2009: 3-7 [doi]

2006

Behavioral Test EconomicsScott Davidson, Anthony P. Ambler, Helen Davidson. itc 2006: 1-9 [doi]

Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and SystemTaikyeong T. Jeong, Anthony P. Ambler. iccsa 2006: 531-536 [doi]

2005

Reduction of Power and Test Time by Removing Cluster of Don t-Care from Test Data SetIl-soo Lee, Yu-Ting Lin, Anthony P. Ambler. isvlsi 2005: 255-256 [doi]

Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test VolumeIl-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler. isvlsi 2005: 194-199 [doi]

2002

Is It Rocket Science?Anthony P. Ambler. itc 2002: 1188-1189 [doi]

System Manufacturing Test Cost ModelDavid Williams, Anthony P. Ambler. itc 2002: 482-490 [doi]

2001

From DFT to systems test - a model based cost optimization toolMichael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman. date 2001: 302-306 [doi]

1997

The Economics of System-Level TestingDes Farren, Anthony P. Ambler. dt, 14(3):51-58, 1997. [doi]

1995

Cost-Effective System-Level Test StrategiesDes Farren, Anthony P. Ambler. itc 1995: 807-813

1994

Test strategy planning using economic analysisI. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. Dick. et, 5(2-3):137-155, 1994. [doi]

Sensitivity analysis in economics based test strategy planningJ. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler. et, 5(2-3):239-251, 1994. [doi]

System Test Cost Modelling Based on Event Rate AnalysisDes Farren, Anthony P. Ambler. itc 1994: 84-92

1993

Economics in Design and TestChryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick. iccd 1993: 384-387

Economics Modelling for the Determination of Test Strategies for Complex VLSI BoardsChryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler. itc 1993: 210-217

Algorithms for Cost Optimised Test Strategy SelectionChryssa Dislis, J. H. Dick, Anthony P. Ambler. itc 1993: 383-391

1992

A Steady-State Response Test Generation for Mixed-Signal Integrated CircuitsAlaa F. Alani, Gerry Musgrave, Anthony P. Ambler. itc 1992: 415-421

1991

Economic Effects in Design and TestI. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick. dt, 8(4):64-77, 1991. [doi]

1989

Cost Analysis of Test Method EnvironmentsChryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler. itc 1989: 875-883

1988

Estimation of area and performance overheads for testable VLSI circuitsJ. R. Miles, Anthony P. Ambler, K. A. E. Totton. iccd 1988: 402-407 [doi]

1986

Economically Viable Automatic Insertion of Self-Test Features for Custom VLSIMark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear. itc 1986: 232-243

1984

Ultimate: A hardware logic simulation engineM. E. Glazier, Anthony P. Ambler. dac 1984: 336-342 [doi]

An Analysis of the Economics of Self TestPrab Varma, Anthony P. Ambler, Keith Baker. itc 1984: 20-30

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