Benjamin Willsch, Marius te Heesen, Julia Hauser, Stefan Dreiner, Holger Kappert, Holger Vogt. Evaluation of a median threshold based EEPROM-PUF concept implemented in a high temperature SOI CMOS technology. In 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2018, Taormina, Italy, April 9-12, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.