Thomas Charles Wilson, Anupam Basu, Dilip K. Banerji, Jayanti C. Majithia. Test plan generation and concurrent scheduling of tests in the presence of conflicts. In First Great Lakes Symposium on VLSI, 1991, Kalamazoo, MI, USA, March 1-2, 1991. pages 243-248, IEEE, 1991. [doi]
@inproceedings{WilsonBBM91,
title = {Test plan generation and concurrent scheduling of tests in the presence of conflicts},
author = {Thomas Charles Wilson and Anupam Basu and Dilip K. Banerji and Jayanti C. Majithia},
year = {1991},
doi = {10.1109/GLSV.1991.143973},
url = {http://dx.doi.org/10.1109/GLSV.1991.143973},
researchr = {https://researchr.org/publication/WilsonBBM91},
cites = {0},
citedby = {0},
pages = {243-248},
booktitle = {First Great Lakes Symposium on VLSI, 1991, Kalamazoo, MI, USA, March 1-2, 1991},
publisher = {IEEE},
isbn = {0-8186-2170-2},
}