James Wingfield, Jennifer Dworak, M. Ray Mercer. Function-Based Dynamic Compaction and its Impact on Test Set Sizes. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 167-174, IEEE Computer Society, 2003. [doi]
Abstract is missing.