Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt. Modeling the sensitivity of CMOS circuits to radiation induced single event transients. Microelectronics Reliability, 48(1):29-36, 2008. [doi]
@article{WirthVNK08,
title = {Modeling the sensitivity of CMOS circuits to radiation induced single event transients},
author = {Gilson I. Wirth and Michele G. Vieira and Egas Henes Neto and Fernanda Lima Kastensmidt},
year = {2008},
doi = {10.1016/j.microrel.2007.01.085},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.085},
tags = {modeling},
researchr = {https://researchr.org/publication/WirthVNK08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {1},
pages = {29-36},
}