Modeling the sensitivity of CMOS circuits to radiation induced single event transients

Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt. Modeling the sensitivity of CMOS circuits to radiation induced single event transients. Microelectronics Reliability, 48(1):29-36, 2008. [doi]

Abstract

Abstract is missing.