Modeling the sensitivity of CMOS circuits to radiation induced single event transients - researchr publication reviews

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Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt. Modeling the sensitivity of CMOS circuits to radiation induced single event transients. Microelectronics Reliability, 48(1):29-36, 2008. [doi]

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