A failure-resilient xDSL line driver with on-chip degradation monitor - researchr publication authors

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Pieter De Wit, Georges G. E. Gielen. A failure-resilient xDSL line driver with on-chip degradation monitor. In Proceedings of the 37th European Solid-State Circuits Conference, ESSCIRC 2011, Helsinki, Finland, Sept. 12-16, 2011. pages 247-250, IEEE, 2011. [doi]

This author has not been identified. Look up 'Pieter De Wit' in GoogleThis author has not been identified. Look up 'Georges G. E. Gielen' in Google

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