Pieter De Wit, Georges G. E. Gielen. A failure-resilient xDSL line driver with on-chip degradation monitor. In Proceedings of the 37th European Solid-State Circuits Conference, ESSCIRC 2011, Helsinki, Finland, Sept. 12-16, 2011. pages 247-250, IEEE, 2011. [doi]
@inproceedings{WitG11,
title = {A failure-resilient xDSL line driver with on-chip degradation monitor},
author = {Pieter De Wit and Georges G. E. Gielen},
year = {2011},
doi = {10.1109/ESSCIRC.2011.6044953},
url = {http://dx.doi.org/10.1109/ESSCIRC.2011.6044953},
researchr = {https://researchr.org/publication/WitG11},
cites = {0},
citedby = {0},
pages = {247-250},
booktitle = {Proceedings of the 37th European Solid-State Circuits Conference, ESSCIRC 2011, Helsinki, Finland, Sept. 12-16, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0703-2},
}