Effective diagnostics through interval unloads in a BIST environment

Peter Wohl, John A. Waicukauski, Sanjay Patel, Gregory A. Maston. Effective diagnostics through interval unloads in a BIST environment. In Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002. pages 249-254, ACM, 2002. [doi]

Abstract

Abstract is missing.