Heinrich Wolf, Horst A. Gieser, Wolfgang Soldner, Harald Gossner. A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits. Microelectronics Reliability, 45(9-11):1421-1424, 2005. [doi]
@article{WolfGSG05,
title = {A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits},
author = {Heinrich Wolf and Horst A. Gieser and Wolfgang Soldner and Harald Gossner},
year = {2005},
doi = {10.1016/j.microrel.2005.07.032},
url = {http://dx.doi.org/10.1016/j.microrel.2005.07.032},
researchr = {https://researchr.org/publication/WolfGSG05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {9-11},
pages = {1421-1424},
}