Francis G. Wolff, Christos A. Papachristou, David R. McIntyre. Test Compression and Hardware Decompression for Scan-Based SoCs. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 716-717, IEEE Computer Society, 2004. [doi]
Abstract is missing.