Hyosig Won, Katsuhiro Shimazu. Statistical design attribute identification for FinFET outlier and Silicon-to-SPICE gap. In Karan S. Bhatia, Massimo Alioto, Danella Zhao, Andrew Marshall, Ramalingam Sridhar, editors, 29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016. pages 35-40, IEEE, 2016. [doi]
Abstract is missing.