Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability

Justin S. Wong, Peter Y. K. Cheung. Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability. IEEE Trans. VLSI Syst., 21(12):2307-2320, 2013. [doi]

Authors

Justin S. Wong

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Peter Y. K. Cheung

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