Justin S. Wong, Peter Y. K. Cheung. Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability. IEEE Trans. VLSI Syst., 21(12):2307-2320, 2013. [doi]
@article{WongC13-0,
title = {Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability},
author = {Justin S. Wong and Peter Y. K. Cheung},
year = {2013},
doi = {10.1109/TVLSI.2012.2230280},
url = {http://dx.doi.org/10.1109/TVLSI.2012.2230280},
researchr = {https://researchr.org/publication/WongC13-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {21},
number = {12},
pages = {2307-2320},
}