Stitching defect detection and classification using wavelet transform and BP neural network - researchr publication authors

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W. K. Wong, C. W. M. Yuen, D. D. Fan, L. K. Chan, E. H. K. Fung. Stitching defect detection and classification using wavelet transform and BP neural network. Expert Syst. Appl., 36(2):3845-3856, 2009. [doi]

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