W. K. Wong, C. W. M. Yuen, D. D. Fan, L. K. Chan, E. H. K. Fung. Stitching defect detection and classification using wavelet transform and BP neural network. Expert Syst. Appl., 36(2):3845-3856, 2009. [doi]
@article{WongYFCF09,
title = {Stitching defect detection and classification using wavelet transform and BP neural network},
author = {W. K. Wong and C. W. M. Yuen and D. D. Fan and L. K. Chan and E. H. K. Fung},
year = {2009},
doi = {10.1016/j.eswa.2008.02.066},
url = {http://dx.doi.org/10.1016/j.eswa.2008.02.066},
tags = {classification, C++},
researchr = {https://researchr.org/publication/WongYFCF09},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {36},
number = {2},
pages = {3845-3856},
}