The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study - researchr publication authors

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Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee. The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study. In 6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001. pages 73-78, IEEE Computer Society, 2001. [doi]

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