Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee. The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study. In 6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001. pages 73-78, IEEE Computer Society, 2001. [doi]
@inproceedings{WorsmanWL01,
title = {The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study},
author = {Matthew Worsman and Mike W. T. Wong and Yim-Shu Lee},
year = {2001},
doi = {10.1109/ETW.2001.946666},
url = {https://doi.org/10.1109/ETW.2001.946666},
researchr = {https://researchr.org/publication/WorsmanWL01},
cites = {0},
citedby = {0},
pages = {73-78},
booktitle = {6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001},
publisher = {IEEE Computer Society},
isbn = {0-7695-1017-5},
}