Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure - researchr publication authors

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N. Wrachien, D. Bari, J. Kovác, J. Jakabovic, D. Donoval, Gaudenzio Meneghesso, A. Cester. Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure. Microelectronics Reliability, 52(9-10):2490-2494, 2012. [doi]

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