N. Wrachien, D. Bari, J. Kovác, J. Jakabovic, D. Donoval, Gaudenzio Meneghesso, A. Cester. Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure. Microelectronics Reliability, 52(9-10):2490-2494, 2012. [doi]
@article{WrachienBKJDMC12,
title = {Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure},
author = {N. Wrachien and D. Bari and J. Kovác and J. Jakabovic and D. Donoval and Gaudenzio Meneghesso and A. Cester},
year = {2012},
doi = {10.1016/j.microrel.2012.06.055},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.055},
researchr = {https://researchr.org/publication/WrachienBKJDMC12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {9-10},
pages = {2490-2494},
}