Cheng-Wen Wu. Special session: Hot topic design and test of 3D and emerging memories. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 328, IEEE Computer Society, 2011. [doi]
@inproceedings{Wu11-21,
title = {Special session: Hot topic design and test of 3D and emerging memories},
author = {Cheng-Wen Wu},
year = {2011},
doi = {10.1109/VTS.2011.5783744},
url = {http://dx.doi.org/10.1109/VTS.2011.5783744},
tags = {testing, design},
researchr = {https://researchr.org/publication/Wu11-21},
cites = {0},
citedby = {0},
pages = {328},
booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
publisher = {IEEE Computer Society},
}