Special session: Hot topic design and test of 3D and emerging memories

Cheng-Wen Wu. Special session: Hot topic design and test of 3D and emerging memories. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 328, IEEE Computer Society, 2011. [doi]

Abstract

Abstract is missing.