David M. Wu. DFT is all I can afford, who cares about Design for Yield or Design for Reliability!. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 1141-1142, IEEE Computer Society, 1999.
@inproceedings{Wu99:0,
title = {DFT is all I can afford, who cares about Design for Yield or Design for Reliability!},
author = {David M. Wu},
year = {1999},
tags = {reliability, design},
researchr = {https://researchr.org/publication/Wu99%3A0},
cites = {0},
citedby = {0},
pages = {1141-1142},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}