Meng-Shan Wu, Yen-Lin Chua, Jin-Fu Li 0001, Yun-Ting Chuan, Shih-Hsu Huang. Fault-Aware ECC Scheme for Enhancing the Read Reliability of STT-MRAMs. In IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.