An efficient test-data compaction for low power VLSI testing - researchr publication authors

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Po-Han Wu, Tsung-Tang Chen, Wei-Lin Li, Jiann-Chyi Rau. An efficient test-data compaction for low power VLSI testing. In 2008 IEEE International Conference on Electro/Information Technology, EIT 2008, held at Iowa State University, Ames, Iowa, USA, May 18-20, 2008. pages 237-241, IEEE, 2008. [doi]

This author has not been identified. Look up 'Po-Han Wu' in GoogleThis author has not been identified. Look up 'Tsung-Tang Chen' in GoogleThis author has not been identified. Look up 'Wei-Lin Li' in GoogleThis author has not been identified. Look up 'Jiann-Chyi Rau' in Google

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