An efficient test-data compaction for low power VLSI testing

Po-Han Wu, Tsung-Tang Chen, Wei-Lin Li, Jiann-Chyi Rau. An efficient test-data compaction for low power VLSI testing. In 2008 IEEE International Conference on Electro/Information Technology, EIT 2008, held at Iowa State University, Ames, Iowa, USA, May 18-20, 2008. pages 237-241, IEEE, 2008. [doi]

Abstract

Abstract is missing.