Yishan Wu, Puyang Cai, Zhiwei Liu, Pengpeng Ren, Zhigang Ji. Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{WuCLRJ23,
title = {Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM},
author = {Yishan Wu and Puyang Cai and Zhiwei Liu and Pengpeng Ren and Zhigang Ji},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118078},
url = {https://doi.org/10.1109/IRPS48203.2023.10118078},
researchr = {https://researchr.org/publication/WuCLRJ23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}