Yishan Wu, Puyang Cai, Zhiwei Liu, Pengpeng Ren, Zhigang Ji. Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.