Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch

Kun Wu, Nanlin Guo, Fei Li, Nengyong Zhu, Jun Tao 0001, Xin Li. Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(5):1618-1622, May 2023. [doi]

Abstract

Abstract is missing.