PCB Defect Detection Using Deep Learning Methods

Xing Wu, Yuxi Ge, Qingfeng Zhang, Dali Zhang. PCB Defect Detection Using Deep Learning Methods. In Weiming Shen 0001, Jean-Paul A. Barthès, Junzhou Luo, Yanjun Shi, Jinghui Zhang, editors, 24th IEEE International Conference on Computer Supported Cooperative Work in Design, CSCWD 2021, Dalian, China, May 5-7, 2021. pages 873-876, IEEE, 2021. [doi]

Authors

Xing Wu

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Yuxi Ge

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Qingfeng Zhang

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Dali Zhang

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