Xing Wu, Yuxi Ge, Qingfeng Zhang, Dali Zhang. PCB Defect Detection Using Deep Learning Methods. In Weiming Shen 0001, Jean-Paul A. Barthès, Junzhou Luo, Yanjun Shi, Jinghui Zhang, editors, 24th IEEE International Conference on Computer Supported Cooperative Work in Design, CSCWD 2021, Dalian, China, May 5-7, 2021. pages 873-876, IEEE, 2021. [doi]
Abstract is missing.