Xing Wu, Yuxi Ge, Qingfeng Zhang, Dali Zhang. PCB Defect Detection Using Deep Learning Methods. In Weiming Shen 0001, Jean-Paul A. Barthès, Junzhou Luo, Yanjun Shi, Jinghui Zhang, editors, 24th IEEE International Conference on Computer Supported Cooperative Work in Design, CSCWD 2021, Dalian, China, May 5-7, 2021. pages 873-876, IEEE, 2021. [doi]
@inproceedings{WuGZZ21,
title = {PCB Defect Detection Using Deep Learning Methods},
author = {Xing Wu and Yuxi Ge and Qingfeng Zhang and Dali Zhang},
year = {2021},
doi = {10.1109/CSCWD49262.2021.9437846},
url = {https://doi.org/10.1109/CSCWD49262.2021.9437846},
researchr = {https://researchr.org/publication/WuGZZ21},
cites = {0},
citedby = {0},
pages = {873-876},
booktitle = {24th IEEE International Conference on Computer Supported Cooperative Work in Design, CSCWD 2021, Dalian, China, May 5-7, 2021},
editor = {Weiming Shen 0001 and Jean-Paul A. Barthès and Junzhou Luo and Yanjun Shi and Jinghui Zhang},
publisher = {IEEE},
isbn = {978-1-7281-6597-4},
}