Liang Wu, Mohammad Khizer Hussain, Saed Abughannam, Wolfgang Müller 0003, Christoph Scheytt, Wolfgang Ecker. Analog fault simulation automation at schematic level with random sampling techniques. In 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2018, Taormina, Italy, April 9-12, 2018. pages 1-4, IEEE, 2018. [doi]
@inproceedings{WuHA0SE18,
title = {Analog fault simulation automation at schematic level with random sampling techniques},
author = {Liang Wu and Mohammad Khizer Hussain and Saed Abughannam and Wolfgang Müller 0003 and Christoph Scheytt and Wolfgang Ecker},
year = {2018},
doi = {10.1109/DTIS.2018.8368549},
url = {https://doi.org/10.1109/DTIS.2018.8368549},
researchr = {https://researchr.org/publication/WuHA0SE18},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2018, Taormina, Italy, April 9-12, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5291-6},
}