Analog fault simulation automation at schematic level with random sampling techniques

Liang Wu, Mohammad Khizer Hussain, Saed Abughannam, Wolfgang Müller 0003, Christoph Scheytt, Wolfgang Ecker. Analog fault simulation automation at schematic level with random sampling techniques. In 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2018, Taormina, Italy, April 9-12, 2018. pages 1-4, IEEE, 2018. [doi]

Abstract

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