Fault simulation and test algorithm generation for random accessmemories

Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Cheng-Wen Wu. Fault simulation and test algorithm generation for random accessmemories. IEEE Trans. on CAD of Integrated Circuits and Systems, 21(4):480-490, 2002. [doi]

Abstract

Abstract is missing.