Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment

Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase. Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment. IEEE Trans. on CAD of Integrated Circuits and Systems, 28(11):1767-1776, 2009. [doi]

Authors

Meng-Fan Wu

This author has not been identified. Look up 'Meng-Fan Wu' in Google

Jiun-Lang Huang

This author has not been identified. Look up 'Jiun-Lang Huang' in Google

Xiaoqing Wen

This author has not been identified. Look up 'Xiaoqing Wen' in Google

Kohei Miyase

This author has not been identified. Look up 'Kohei Miyase' in Google